Analysis of Impurities in Sulfur Hexafluoride Gas via Gas Chromatography Based on Enhanced Plasma Detector
نویسندگان
چکیده
Abstract An analytical method for detecting impurities in high-purity sulfur hexafluoride (SF 6 ) gas is established by using chromatography (GC) based on the enhanced plasma detector (EPD). The concentration of (hydrogen, oxygen, nitrogen, methane, carbon monoxide, dioxide, tetrafluoride, hexafluoroethane, and octafluoropropane) can be quantitatively detected through one-time sampling external standard method, minimum detection limit each component calculated to about 0.1ppm, RSD test results less than 3%. This meet requirements purity SF used electrical equipment.
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ژورنال
عنوان ژورنال: Journal of physics
سال: 2023
ISSN: ['0022-3700', '1747-3721', '0368-3508', '1747-3713']
DOI: https://doi.org/10.1088/1742-6596/2428/1/012014